10 LIBROS DEL HINDI RELACIONADOS CON «द्यूतमंडल»
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1
X-Parameters: Characterization, Modeling, and Design of ... - Page 118
Even though (5.10) and (5.11) describe the DUT parameterized by 111, the equations represent the DUT properly in any circuit into which it is placed, whether or not the DUT model is presented with a fixed impedance. For example, consider ...
David E. Root, Jan Verspecht, Jason Horn, 2013
2
SystemVerilog Assertions and Functional Coverage: Guide to ...
255 17.1.1 LAB1: 'bind' DUT Model and Test-Bench . . . . . . . 255 17.1.2 LAB1: Questions . . . . . . . . . . . . . . . . . . . . . . . . . 258 17.2 LAB 2: Overlap and Non-Overlap Operators . . . . . . . . . . . . 261 17.2.1 LAB2 DUT Model and Test-Bench .
3
Modeling and Simulation for RF System Design - Page 259
First, the DUT model is inserted into the testbench schematic. The schematic contains the test environment (sources and measurement blocks). The port model, psin for example, can be used to realize a signal source for various analyses as ...
Ronny Frevert, Joachim Haase, Roland Jancke, 2006
4
Architecture of Computing Systems - ARCS 2011: 24th ... - Page 95
For the presented prototype implementation, the part responsible for generating the processor SW code extracts the DUT control sequences and the test algorithm information from the DUT model. Based on this information, intermediate code ...
Mladen Berekovic, William Fornaciari, Uwe Brinkschulte, 2011
5
Advanced Verification Topics - Page 182
The example shows: • How to define the data type (packet) • How to drive the DUT model from the testbench • How to monitor the output from the DUT model • Multi-language UVM considerations Connecting between Languages using TLM ...
Bishnupriya Bhattacharya, John Decker, Gary Hall, 2012
The least- mean square (LMS) adaptive algorithm is used to identify the DUT model. While maintaining comparable accuracy this technique provides a more flexible test procedure than conventional methods, in terms of the frequency ...
Institute of Electrical and Electronics Engineers, IEEE Computer Society, 1995
7
Formal Approaches to Software Testing and Runtime ... - Page 171
The run-time system queries the DUT model for checker signal changes and reports checker violation or success. The compilation flow overview is shown in Fig. 3; the simulation paradigm is shown in Fig. 4. COMPILER OPTIMIZATIONS: The ...
Klaus Havelund, Manuel Núnez, Grigore Rosu, 2006
8
Advances in Electronic Testing: Challenges and Methodologies
S. Re, M. Li, “A Generic Test Path and DUT Model for Datacom ATE”, IEEE International Test Conference, 2003, pp. 528–536. T. Sargent, “Physical Principles of Interface Design”, IEEE International Test Conference, 2002, pp. 549–554.
Dimitris Gizopoulos, 2006
9
Verification Methodology Manual for SystemVerilog - Page 116
... may have a mechanism that bypasses the physical interface to peek and poke the register values directly into the DUT model. Such choice should be selectable at run time, where all subsequent register accesses would be done in the same ...
Janick Bergeron, Eduard Cerny, Alan Hunter, 2006
10
Human-Intelligence-Based Manufacturing - Page 167
These, by progressive application of cognitive In-Dut Model pottern Pottern recognition Decision-Moking Folctors Frolme Pose -. Fig. 7.12. Average required time for process planning. _j Final process plan L. Anthropocentric Intelligence-Based ...
