«ELECTRON PROBE MICROANALYSIS»に関連する英語の本
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electron probe microanalysisの使いかたを見つけましょう。
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1
Electron Probe Quantitation
These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach.
K.F.J. Heinrich, D. Newbury, 1991
2
Symposium on Advances in
Electron Metallography and
Electron ...
X-RAY DIFFRACTION IN THE ELECTRON PROBE MICROANALYZER* By B. H.
Heise1 Synopsis The electron probe microanalyzer is shown to be a useful X-ray
diffraction instrument which produces a particular type of diffraction pattern ...
3
Scanning
Electron Microscopy: Physics of Image Formation and ...
[10.99] G. Springer: The correction for continuum fluorescence in electron probe
microanalysis. Neues Jahrbuch Miner. Abh. 106, 241 (1967) [10.100] G. Springer
: Fluorescence by continuum radiation in multi-element targets. In 6th Int'l.
4
Catalog of National Bureau of Standards publications, 1966-1976
SP305-6. Electron probe; Lunar samples; Microanalysis; Minerals; Rocks;
Analysis; //995. SP305-3. Electron probe; Microanalysis; Metallurgy;
Spectrometry; X- rays; Applications; 1 1586. SP305-2. Electron probe;
Microanalysis; Microscopy; ...
United States. National Bureau of Standards. Technical Information and Publications Division, Betty L. Burris, Rebecca J. Morehouse, 1978
5
Quantitative
Electron-
Probe Microanalysis
This volume provides a balanced treatment of both practical and theoretical aspects of the techniques of electron-probe microanalysis, and is particularly valuable for both the practical microanalyst interested in problems of specimen ...
6
Publications of the National Bureau of Standards ... catalog
Electron probe; Microanalysis; Scanning electron microscopy; X-ray spectrometry
; Cathodoluminescence; Electron backscatter; 10651. Electron probe analysis;
Metallography; Powder metallurgy; Spectrometric standards; Standard Reference
...
United States. National Bureau of Standards, 1968
7
Publications of the National Bureau of Standards, 1976 ...
Electron microscopy; electron probe microanalysis; electron- specimen
interactions; Monte Carlo electron trajectory simulation; scanning electron
microscopy; x-ray generation; SP460, pp. 45-60 (Dec. 1976). Electron
microscopy; Fe-Cr alloys; ...
United States. National Bureau of Standards, Betty L. Burris, 1977
Quantitative electron probe microanalysis: absorption correction uncertainty.
Milcrochim. Acta pp. 182-200. Kelly, C. J ., Short, M. A., and Reynolds, 0. A. (1971
). Pulse height stabilization in gas proportional X-ray detector systems. Proc. Nat.
Helmut Erich Landsberg, Jacques van Mieghem, 1973
9
X-Ray Spectrometry: Recent Technological Advances
Bastin, G. F., Dijkstra, J. M., Heijligers, H. J. M. PROZA96: an improved matrix
correction program for electron probe microanalysis, based on a double
gaussian φ(ρz) approach. X-ray Spectrom., 27, 3–10 (1998). Bastin, G. F.,
Dijkstra, J. M., ...
Kouichi Tsuji, Jasna Injuk, René Van Grieken, 2005
10
X-ray
Microanalysis in Biology: Experimental Techniques and ...
Karl Zierold A Introduction Electron probe microanalysis is a sensitive tool to
localise elements in biological cells and tissues. In comparison to most
specimens studied by this method in materials sciences, cells are not static
objects, but vary in ...
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Analysis shows elements not acting in nature as previously modeled
Measurements were performed on beamlines at the Stanford Synchrotron Radiation Lightsource. Quantitative electron probe microanalysis of ... «Phys.Org, 6月 15»
Using Automated Multivariate Statistical Phase Analysis of EDS …
... material evaluation is performed using X-ray diffraction (XRD), inductively-coupled plasma (ICP) and electron probe microanalysis (EPMA). «Azom.com, 5月 15»
Mineral 'fingerprints' to aid more cost-effective exploration
... mass spectrometry (LA-ICP-MS) and electron probe microanalysis (EPMA), that allow measurements with increasingly lower detection limits, ... «Australian Mining, 6月 14»
Iron-bearing minerals in sediments react with and immobilize …
... x-ray photoelectron spectroscopy to determine the surface composition of these minerals, and electron probe microanalysis to determine the ... «Phys.Org, 2月 14»
Achieving Sub-Nanometer Depth Resolution Energy (EXLIE) SIMS …
Since pioneering Electron Probe MicroAnalysis (EPMA) in the 1950's and Secondary Ion Mass Spectrometry (SIMS) in the 1960's, CAMECA ... «Azom.com, 10月 10»
AMETEK Acquires Imago Scientific Instruments
... electron probe microanalysis (EPMA) instruments, and optical emission and X-ray fluorescence spectrometers for the metals, environmental, ... «PR Newswire, 4月 10»
Ionic high-pressure form of elemental boron
X-ray electron probe microanalysis (S400, Leica/PGT Spirit and SX-50 Camebax, Cameca) of the recovered samples revealed that the ... «Nature.com, 1月 09»
